Global failure analysis equipment market was valued at USD 4.08 billion in 2012, growing at a CAGR of 8.8% from 2013 to 2019. Rapid growth in nanotechnology coupled with growth in medical applications in the Asia Pacific region has fueled the growth of failure analysis equipment market. In addition, increased investments in research and education infrastructure are also propelling the growth of failure analysis equipment market. However, high cost of failure analysis equipment leads to low adoption rate of these, especially in the cost sensitive countries of Asia Pacific region. Thereby, hinders the growth of failure analysis equipment to an extent. On the other hand, growing innovative techniques such as super-resolution microscopy and correlative light and electron microscopy (CLEM) are excellent opportunities for the market which are expected to bolster the failure analysis equipment market in the years to come.
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In 2012, Asia Pacific was the largest revenue generator for the failure analysis equipment market. The dominance by Asia Pacific is due to large number of countries such as China, India, Japan, Taiwan and Australia among others investing heavily in research and development infrastructure, nanotechnology as well as medical technologies. Similarly, North America and Europe collectively accounted for over one-third of the market share, as these have been continually focusing on research and development and have been using failure analysis equipment for R&D purpose.
Focused Ion Beam system (FIB) and Transmission Electron Microscope (TEM) accounted for majority market share in 2012, owing to rapid usage of these equipments. However, Dual Beams systems (FIB/SEM) are expected to grow at the fastest pace in the years to come owing to the several advantages over a single-beam FIB system, especially for sample preparation and microscopy applications. Thus, Dual Beam systems (FIB/SEM) are expected to grow over the forecast period.
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Secondary ion mass spectroscopy (SIMS) accounted for majority market share in the year 2012 owing to several advantages such as the ability to identify elements present in very low concentration levels and the ability to identify all elements such as helium and hydrogen. Focused Ion Beam (FIB) techniques are used in applications such as die surface milling or cross-sectioning, high magnification microscopy and even material deposition. Thus, the usage in wide array of applications is expected to drive the FIB technology over the forecasted period from 2013 to 2019.
The global failure analysis equipment market has been segmented by equipment into Scanning Electron Microscope (SEM), Transmission Electron Microscope (TEM), Focused Ion Beam Systems (FIB) and Dual Beam (FIB/SEM) Systems. The key industry participants include FEI Company, Hitachi High-Technologies Europe GmbH, Carl Zeiss SMT GmbH and JEOL, Ltd. among others.
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